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SAE J1752/1_200610

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Electromagnetic Compatibility Measurement Procedures for Integrated Circuits – Integrated Circuit EMC Measurement Procedures – General and Definitions
standard by SAE International, 10/13/2006

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Description

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J 1752 series of documents.

Product Details

Published:
10/13/2006
File Size:
1 file , 150 KB