Description
This test method is offered as standardized procedure to determine the alpha particle Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flipflops) by measuring the error rate while the device is irradiated by a characterized, solid alpha source.
Product Details
- Published:
- 10/01/2007
- Number of Pages:
- 19
- File Size:
- 1 file , 150 KB
