Sale!

JEDEC JESD6 (R2002)

$29.50

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
standard by JEDEC Solid State Technology Association, 02/01/1967

Category:

Description

This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.

Product Details

Published:
02/01/1967
Number of Pages:
17
File Size:
1 file , 280 KB