Description
The Cycled Temperature-Humidity-Bias Life Test is typically performed on cavity packages(e.g., MQUADs, lidded ceramic pin grid arrays, etc.) as an alternative to JESD22-A101 or JESD22-A110.
The Cycled Temperature-humidity “Biased Life Test is performed for the purpose of evaluating thereliability of non-hermetic, packaged solid state devices in humidity environments when surfacecondensation is likely. It employs conditions of bias, temperature cycling and high humidity that willcause condensation to occur on the device surface. It is useful to determine device surface susceptibilityto corrosion and/or dendritic growth.
For most applications test method JESD22-A110 “Highly Accelerated Temperature and Humidity StressTest (HAST)” or JESD22-A101 “Steady State Temperature, Humidity, Biased Life Test” is preferred.
Product Details
- Published:
- 07/01/2013
- Number of Pages:
- 12
- File Size:
- 1 file , 110 KB
