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JEDEC JEP138

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USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE
standard by JEDEC Solid State Technology Association, 09/01/1999

Category:

Description

The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance.

Product Details

Published:
09/01/1999
Number of Pages:
11
File Size:
1 file , 54 KB