Description
1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.
1.2 Units – The values stated in the International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Product Details
- Published:
- 01/01/2003
- Number of Pages:
- 3
- File Size:
- 1 file , 31 KB
