Description
1.1 This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (±33 % of the average of two runs) should be expected for replicate counts on the same sample.
Product Details
- Published:
- 10/01/2015
- Number of Pages:
- 4
- File Size:
- 1 file , 92 KB
