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ASTM F3166-16

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Standard Specification for High-Purity Titanium Sputtering Target Used for Through-Silicon Vias (TSV) Metallization
standard by ASTM International, 05/01/2016

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Description

1.1 This specification details the generic criteria requirements of high pure titanium sputtering targets used as thin film material for through-silicon vias (TSV) metallization in advance packaging.

Product Details

Published:
05/01/2016
Number of Pages:
5
File Size:
1 file , 110 KB