Description
1.1 This test method covers the measurement of the threshold level of radiation dose rate that causes upset in digital integrated circuits only under static operating conditions. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
Product Details
- Published:
- 05/01/2016
- Number of Pages:
- 7
- File Size:
- 1 file , 170 KB
- Redline File Size:
- 2files, 390 KB
