Description
1.1 This practice covers the measurement of the response of linear integrated circuits, under given operating conditions, to pulsed ionizing radiation. The response may be either transient or more lasting, such as latchup. The radiation source is either a flash X-ray machine (FXR) or an electron linear accelerator (LINAC).
Product Details
- Published:
- 05/01/2016
- Number of Pages:
- 6
- File Size:
- 1 file , 140 KB
- Redline File Size:
- 2files, 280 KB
