Description
SAE J1752/3_201709 defines a method for measuring the electromagnetic radiation from an integrated circuit(IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port(referred to as a wall port) cut in the top or bottom of a TEM or wideband TEM (GTEM) cell. The test board is not in thecell as in the conventional usage but becomes a part of the cell wall.
Product Details
- Published:
- 09/22/2017
- Number of Pages:
- 16
- File Size:
- 1 file , 3.3 MB
