Description
This noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a l/f (power inversely proportional to frequency) power distribution. Formerly known as RS-353 and/or EIA-353.
Product Details
- Published:
- 04/01/1968
- Number of Pages:
- 9
- File Size:
- 1 file , 240 KB
