Sale!

JEDEC JESD47J

$37.00

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 08/01/2017

Category:

Description

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.

Product Details

Published:
08/01/2017
Number of Pages:
30
File Size:
1 file , 290 KB