Description
This document provides a unified collection of the commonly used terms and definitions in the area of semiconductor thermal measurements. The terms and definitions provided herein extend beyond those used in the JESD51 family of documents to include other often used terms and definitions in the area of semiconductor thermal measurements.
Product Details
- Published:
- 06/01/2009
- Number of Pages:
- 14
- File Size:
- 1 file , 160 KB
