Description
This method is for determining metals in samples of unknown composition such as residues and deposits. Aluminum (Al), cadmium (Cd), calcium (Ca), chromium (Cr), cobalt (Co), copper (Cu), iron (Fe), lead (Pb), magnesium (Mg), manganese (Mn), molybdenum (Mo), nickel (Ni), potassium (K), sodium (Na), strontium (Sr), tin (Sn), titanium (Ti), vanadium (V), zinc (Zn), and zirconium (Zr) are quantitatively determined by Inductively Coupled Plasma – Optical Emission Spectrometry (ICP-OES). Concentrations determined generally cover the range of 0.02 to several mass-%, see Table 1. Sample dilution extends the working range for major (matrix) components. If requested, additional elements can be determined, if the sample preparation method is appropriate for the additional elements.
Barium (Ba) and silicon (Si) cannot be determined by this method due to the acid treatment of samples. Alpha-alumina will not dissolve in the acid media used in this method.
An alternative microwave-based dissolution technique is described in the Appendix. Silicon can be determined using the microwave-based dissolution technique; and instructions for the analysis of silicon are included.
Product Details
- Published:
- 02/28/2007
- Number of Pages:
- 11
- File Size:
- 1 file , 170 KB
