Description
1.1 This test method covers determination of ductility utilizing Epstein test strips and a bending device for bending the strip over a predetermined radius. It is intended for commercial silicon-bearing steel sheet or strip of nonoriented types in the thickness range from 0.010 to 0.031 in. [0.25 to 0.79 mm], inclusive.
Product Details
- Published:
- 04/01/2016
- Number of Pages:
- 2
- File Size:
- 1 file , 79 KB
